Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale

BIB
O.C. Haenssler
Int. Conf. on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014
10 / 2014
inproceedings
5
10.1109/3M-NANO.2014.7057302