Understanding Ageing Mechanisms

BIB
Domenik Helms, Daniele Rossi, Haider Muhi Abbas, Mohd Syafiq Mispan, Shengyu Duan, Lorena Anghel, Helena-Maria Dounavi, Gaole Sai
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
2020
978-3-030-23781-3
book
Springer
MoRV
Modelling reliability under variability