Advanced Atomic Force Microscope based System for Manipulation at the Nanoscale
Krohs, F. and Weigel-Jech, M. and Mick, U. and Isken, M. and Fatikow, S. and
Proceedings of the 9th International IFAC Symposium on Robot Control (SYROCO2009)
09 / 2009
inproceedings
