Depth-Detection Methods for Microgripper based CNT Manipulation in a Scanning Electron Microscope
Eichhorn, V. and Fatikow, S. and Wich, T. and Dahmen, C. and Sievers, T. and Andersen, K.N. and Carlson, K. and Bøggild, P.
01 / 2008
article
Springer
Springer
