Simulation of Probe Misalignment Effects during RF On-Wafer Probing - OFFIS

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Simulation of Probe Misalignment Effects during RF On-Wafer Probing

Simulation of Probe Misalignment Effects during RF On-Wafer Probing

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All authors

F.T. von Kleist-Retzow, O.C. Haenssler, S. Fatikow

Booktitle

41st Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2016

Publishing date

09 / 2016

Type of Publication

conference

Organization

Technical University of Denmark

Doi

10.1109/IRMMW-THz.2016.7758851

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