Accurate PTV, State, and ABB Aware RTL Blackbox Modeling of Subthreshold, Gate, and PN-Junction Leakage

BIB
Tagungsband
09 / 2006
3-54039094
inproceedings
Springer
56-65
CLEAN
Controlling LEAkage power in NanoCMOS SoCs
Springer

OFFIS Autoren