Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron Microscope

BIB
K. Haddadi, O.C. Haenssler, C. Boyaval, G. Dambrine, D. Theron
IEEE MTT-S International Microwave Symposium (IMS), 2017
06 / 2017
conference
IEEE MTT-S
3