Embedded tutorial: Analog-/mixed-signal verification methods for AMS coverage analysis

BIB
Erich Barke and Andreas Fuertig and Georg Glaeser and Christoph Grimm and Lars Hedrich and Stefan Heinen and Eckhard Hennig and Hyun-Sek Lukas Lee and Wolfgang Nebel and Gregor Nitsche and Markus Olbrich and Carna Radojicic and Fabian Speicher
2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016
5 / 2016
inproceedings
IEEE
1102--1111
ANCONA
Analog-Coverage in der Nanoelektronik (sorry - only available in german)
Luca Fanucci and Jürgen Teich