Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope - OFFIS

Your browser does not support JavaScript!

To use all the features of this page, you need JavaScript!<br> Please update your browser or enable JavaScript in your settings.

Home
OFFIS
Publikationen
Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope

Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope

Export

All authors

Fatikow, S. and Eichhorn, V. and Wich, T. and Sievers, T. and Hänßler, O. and Norstrøm, K. Andersen

Booktitle

IEEE International Conference on Mechatronics and Automation (ICMA)

Publishing date

08 / 2007

Type of Publication

inproceedings

Organization

IEEE

Pages

45-50

Privacy Data Transparency Contact Legals