Automatisierte Handhabung und Montage von anpassbaren AFM-Messspitzen

BIB
Bartenwerfer, M. and Eichhorn, V. and Jasper, D. and Fatikow, S.
Proceedings of the 3rd GMM Workshop on Micro-Nano-Integration
01 / 2011
inproceedings
102-107
NanoBits
Exchangeable and Customizable Scanning Probe Tips