Abstracting TCAD aging models above the circuit level

Malte Metzdorf, Domenik Helms, Reef Eilers, Wolfgang Nebel
DATE - Design, Automation, and Test in Europe
3 / 2015
inproceedings
COMPLEX
COdesign and power Management in PLatform-based design space EXploration
Therminator
Modeling, Control and Management of Thermal Effects in Electronic Circuits of the Future
ROBUST
Designing Robust Nanoelectric Systems
RELY
Design for RELIABILITY of SoCs for Applications like Transportation, Medical, and Industrial Automation
Contrex
Design of embedded mixed-criticality CONTRol systems under consideration of EXtra-functional properties
MoRV
Modelling reliability under variability