Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

BIB
P. Polovodov, C. Brillard, O. C. Haenssler, C. Boyaval, D. Deresmes, S. Eliet, F. Wang, N. Clément, D. Théron, G. Dambrine and K. Haddadi
IEEE MTT-S Int. Conf. on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
10 / 2018
conference
4
10.1109/NEMO.2018.8503487