Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis
K. Haddadi, O.C. Haenssler, K. Daffe, S. Eliet, C. Boyaval, D. Theron, G. Dambrine
2017 IEEE MTT-S Int. Microwave Workshop Series on
09 / 2017
conference
IEEE MTT-S
Advanced Materials and Processes (IMWS-AMP)
