The CATRENE / BMBF project RELY (grant number 01M3091) develops new methods for the design of reliable embedded systems for applications such as transportation, medical and automation. The OFFIS group "Analysis of Nanometer ICs" in cooperation with Infineon and TU Munich researches one of the most relevant aging effects of modern transistor technologies - the Bias Temperature Instability effect. This deteriorates over operating periods of years, the performance of the transistors. In traditional embedded systems this effect is not noticeable at first, until it finally comes to an almost simultaneous failure of many subsystems. Depending on the application, this may have different effects: While it is perfectly acceptable for communication devices to have a life span of just a few years, use of these new technologies would result to a virtually guaranteed failure in the automotive and aircraft application and thus to increased maintenance costs due to preventive replacement of systems. For implanted systems, which require that a maintenance can be avoided for many years, the latest technology without a new design techniques is almost unthinkable.
Eilers, Reef and Bergemann, Carl and Helms, Domenik and Nebel, Wolfgang; Proceedings of edaWorkshop 2013; 05 / 2013
Helms, Domenik and Eilers, Reef and Oppenheimer, Frank and Nebel, Wolfgang; Proceedings of the 2013 IEEE European Test Symposium; 05 / 2013
Eilers, Reef and Metzdorf, Malte and Rosinger, Sven and Helms, Domenik and Nebel, Wolfgang; 009 / 2012