@inproceedingsHel2013, Author = {Helms, Domenik and Eilers, Reef and Oppenheimer, Frank and Nebel, Wolfgang}, Title = {RELY - Design for Reliability of SoCs}, Year = {2013}, Month = {5}, Editor = {Patrick Girard}, Booktitle = {Proceedings of the 2013 IEEE European Test Symposium}, Organization = {LIRMM}, type = {inproceedings}, note = {The Catrene project RELY focusses on the characterization of recent ageing mechanisms, developing modelling concepts describing ageing at different levels of the design process and on developing high-level optimization techniques, increasing the reliabili}, Abstract = {The Catrene project RELY focusses on the characterization of recent ageing mechanisms, developing modelling concepts describing ageing at different levels of the design process and on developing high-level optimization techniques, increasing the reliability of systems, made of recent technology’s transistors. The RELY consortium consist of five major integrated device manufacturers (IDMs), application partners from the automotive, avionic and medical domain, EDA software providers as well as eight institutes and universities from Germany, France, the Netherlands and Romania.} @COMMENTBibtex file generated on