Dr.-Ing. Olaf C. Hänßler Wissenschaftlicher Mitarbeiter

Dr.-Ing. Olaf C. Hänßler
Kontaktdaten
Tätigkeiten

Position im OFFIS

Wissenschaftlicher Mitarbeiter

Forschungsbereiche

Gesundheit / Automatisierungs- und Integrationstechnik

Position an der Uni

Forschungsingenieur

Weitere Aktivitäten

Dozent, IEEE Senior member

Forschungsinteresse

Mikrowellen-Mikroskopie und Nanorobotik
News

+49-441-798-4332

o.haenssler(at)uol.de

A1-3-301

UNI

Publikationen
von Dr.-Ing. Olaf C. Hänßler

2018

Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors

O.C. Haenssler, S. Fatikow, D. Théron; J. of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena; 01 / 2018

DOI BIB
Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy

O.C. Haenssler, M.F. Wieghaus, A. Kostopoulos, G. Doundoulakis, E.Aperathitis, S.Fatikow, G.Kiriakidis; J. of Micro-Bio Robotics; 06 / 2018

DOI BIB

2017

Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis

K. Haddadi, O.C. Haenssler, K. Daffe, S. Eliet, C. Boyaval, D. Theron, G. Dambrine; 2017 IEEE MTT-S Int. Microwave Workshop Series on ; 09 / 2017

DOI BIB
Combining Scanning Microscopy and Robotics: Automated Analysis and Manipulation on the Small Scale

M. Bartenwerfer, T. Tiemerding, O.C. Haenssler, S. Fatikow; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

DOI BIB
Memristor Device Characterization by Scanning Microwave Microscopy

G. Sassine, N. Najjari, N. Defrance, O. C. Haenssler , D. Theron, F. Alibart, K. Haddadi; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

BIB
Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron Microscope

K. Haddadi, O.C. Haenssler, C. Boyaval, G. Dambrine, D. Theron; IEEE MTT-S International Microwave Symposium (IMS), 2017; 06 / 2017

BIB
Test standard for Light, Electron and Microwave Microscopy to enable robotic processes

O.C. Haenssler, A. Kostopoulos, G. Doundoulakis, E. Aperathitis, S. Fatikow, G. Kiriakidis; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

DOI BIB

2016

Modularized SPM-Controller based on an FPGA for combined AFM and SMM measurements

M.F. Wieghaus, T. Tiemerding, O.C. Haenssler, S. Fatikow; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2016; 07 / 2016

DOI BIB
Simulation of Probe Misalignment Effects during RF On-Wafer Probing

F.T. von Kleist-Retzow, O.C. Haenssler, S. Fatikow; 41st Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2016; 09 / 2016

DOI BIB

2015

Automated robotic manipulation of individual sub-micro particles using a dual probe setup inside the scanning electron microscope

S. Zimmermann; T. Tiemerding; O.C. Haenssler; S. Fatikow; IEEE International Conference on Robotics and Automation (ICRA), 2015; 2015

BIB
Manipulating and Characterizing with Nanorobotics: In-situ SEM technique for Centimeter and Millimeter Waves

O.C. Haenssler, S. Fatikow; 40th Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2015; 08 / 2015

DOI BIB

2014

Atomic force microscopy for high resolution sidewall scans

F. Krohs, O.C. Haenssler, M. Bartenwerfer; S. Fatikow; Int. Conf. on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO); 10 / 2014

DOI BIB
Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale

O.C. Haenssler; Int. Conf. on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014; 10 / 2014

DOI BIB

2012

Towards High Density Biosensors for Mobile Diagnostics

M. Weigel-Jech, O.C. Haenssler, S. Fatikow; 10 / 2012

DOI BIB

2007

Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope

Fatikow, S. and Eichhorn, V. and Wich, T. and Sievers, T. and Hänßler, O. and Norstrøm, K. Andersen; IEEE International Conference on Mechatronics and Automation (ICMA); 08 / 2007

BIB

2006

Development of an automatic nanorobot cell for handling of Carbon Nanotubes

V. Eichhorn, T. Wich, H. Hülsen, O. Haenssler, T. Sievers, S. Fatikow; MICRO & NANO ROBOTICS; 10 / 2006

BIB

2003

Driving principles of Mobile Microrobots for the Micro- and Nanohandling

A. Kortschack, O. Haenssler, C. Rass, S. Fatikow; Proc. of IEEE/RSJ Int. Conference of Intelligent Robots and Systems (IROS); 10 / 2003

BIB
Multi-Modal Control Interface for a Microrobot-Based Nanohandling Cell

Garnica, S. and Shirinov, A. and Sievers, T. and Kamenik, J. and John, R. and Haenssler, O. and Fatikow, S.; Proc of 2nd VDE World Microtechnologies Congress (MICRO.tec 2003); 10 / 2003

BIB