Dr.-Ing. Olaf C. Hänßler Wissenschaftlicher Mitarbeiter

Dr.-Ing. Olaf C. Hänßler
Kontaktdaten
Tätigkeiten

Position im OFFIS

Wissenschaftlicher Mitarbeiter

Forschungsbereiche

Gesundheit / Automatisierungs- und Integrationstechnik

Position an der Uni

Forschungsingenieur

Weitere Aktivitäten

Dozent, IEEE Senior member

Forschungsinteresse

Mikrowellen-Mikroskopie und Nanorobotik
News

+49-441-798-4332

o.haenssler(at)uol.de

A1-3-301

UNI

Publikationen
von Dr.-Ing. Olaf C. Hänßler

2018

Design and experimental evaluation of a compliant mechanism-based stepping-motion actuator with multi-mode

J. Wei, S. Fatikow, X. Zhang, O.C. Haenssler; Smart Mater. Struct.; 09 / 2018

Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

P. Polovodov, C. Brillard, O. C. Haenssler, C. Boyaval, D. Deresmes, S. Eliet, F. Wang, N. Clément, D. Théron, G. Dambrine and K. Haddadi; IEEE MTT-S Int. Conf. on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO); 10 / 2018

Manipulation of Liquid Metal Inside an SEM by Taking Advantage of Electromigration

F.T. von Kleist-Retzow , O.C. Haenssler, S. Fatikow; J. of Micromechanical Systems; 11 / 2018

Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors

O.C. Haenssler, S. Fatikow, D. Théron; J. of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena; 01 / 2018

Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy

O.C. Haenssler, M.F. Wieghaus, A. Kostopoulos, G. Doundoulakis, E.Aperathitis, S.Fatikow, G.Kiriakidis; J. of Micro-Bio Robotics; 06 / 2018

2017

Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis

K. Haddadi, O.C. Haenssler, K. Daffe, S. Eliet, C. Boyaval, D. Theron, G. Dambrine; 2017 IEEE MTT-S Int. Microwave Workshop Series on ; 09 / 2017

Combining Scanning Microscopy and Robotics: Automated Analysis and Manipulation on the Small Scale

M. Bartenwerfer, T. Tiemerding, O.C. Haenssler, S. Fatikow; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

Memristor Device Characterization by Scanning Microwave Microscopy

G. Sassine, N. Najjari, N. Defrance, O. C. Haenssler , D. Theron, F. Alibart, K. Haddadi; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

BIB
Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron Microscope

K. Haddadi, O.C. Haenssler, C. Boyaval, G. Dambrine, D. Theron; IEEE MTT-S International Microwave Symposium (IMS), 2017; 06 / 2017

BIB
Test standard for Light, Electron and Microwave Microscopy to enable robotic processes

O.C. Haenssler, A. Kostopoulos, G. Doundoulakis, E. Aperathitis, S. Fatikow, G. Kiriakidis; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017; 07 / 2017

2016

Modularized SPM-Controller based on an FPGA for combined AFM and SMM measurements

M.F. Wieghaus, T. Tiemerding, O.C. Haenssler, S. Fatikow; Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS), 2016; 07 / 2016

Simulation of Probe Misalignment Effects during RF On-Wafer Probing

F.T. von Kleist-Retzow, O.C. Haenssler, S. Fatikow; 41st Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2016; 09 / 2016

2015

Automated robotic manipulation of individual sub-micro particles using a dual probe setup inside the scanning electron microscope

S. Zimmermann; T. Tiemerding; O.C. Haenssler; S. Fatikow; IEEE International Conference on Robotics and Automation (ICRA), 2015; 2015

BIB
Manipulating and Characterizing with Nanorobotics: In-situ SEM technique for Centimeter and Millimeter Waves

O.C. Haenssler, S. Fatikow; 40th Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2015; 08 / 2015

2014

Atomic force microscopy for high resolution sidewall scans

F. Krohs, O.C. Haenssler, M. Bartenwerfer; S. Fatikow; Int. Conf. on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO); 10 / 2014

Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale

O.C. Haenssler; Int. Conf. on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014; 10 / 2014

2012

Towards High Density Biosensors for Mobile Diagnostics

M. Weigel-Jech, O.C. Haenssler, S. Fatikow; 10 / 2012

2007

Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope

Fatikow, S. and Eichhorn, V. and Wich, T. and Sievers, T. and Hänßler, O. and Norstrøm, K. Andersen; IEEE International Conference on Mechatronics and Automation (ICMA); 08 / 2007

BIB

2006

Development of an automatic nanorobot cell for handling of Carbon Nanotubes

V. Eichhorn, T. Wich, H. Hülsen, O. Haenssler, T. Sievers, S. Fatikow; MICRO & NANO ROBOTICS; 10 / 2006

BIB

2003

Driving principles of Mobile Microrobots for the Micro- and Nanohandling

A. Kortschack, O. Haenssler, C. Rass, S. Fatikow; Proc. of IEEE/RSJ Int. Conference of Intelligent Robots and Systems (IROS); 10 / 2003

BIB
Multi-Modal Control Interface for a Microrobot-Based Nanohandling Cell

Garnica, S. and Shirinov, A. and Sievers, T. and Kamenik, J. and John, R. and Haenssler, O. and Fatikow, S.; Proc of 2nd VDE World Microtechnologies Congress (MICRO.tec 2003); 10 / 2003

BIB