@conference{K. 2017,
Author = {K. Haddadi, O.C. Haenssler, K. Daffe, S. Eliet, C. Boyaval, D. Theron, G. Dambrine},
Title = {Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis},

Year = {2017},
Month = {09},
Series = {Advanced Materials and Processes (IMWS-AMP)},
Booktitle = {2017 IEEE MTT-S Int. Microwave Workshop Series on },
Organization = {IEEE MTT-S},
Doi = {10.1109/IMWS-AMP.2017.8247419},
type = {conference}
}
@COMMENT{Bibtex file generated on }