@inproceedings{Kral2011,Author = {Král, Z. and Urbánek, M. and Mick, U. and Eichhorn, V. and Fatikow, S. and Petrenec, M. and Jiruse, J. and Kolíbalová, E. and Zadrazil, M.},Title = {Hybrid FIB/SEM/SPM System Used for In-situ Analysis of Milling Process on Metallic Thin Films},Year = {2011},Month = {01},Address = {Changchun, China},Booktitle = {Proceedings of the 3M-NANO Conference},type = {inproceedings}}@COMMENT{Bibtex file generated on }