@inproceedings{Hel2009,Author = {Helms, Domenik and Hylla, Kai and Nebel,Wolfgang},Title = {Hybrid Logical-Statistical Simulation with Thermal and IR-Drop Mapping for Degradation and Variation Prediction},Year = {2009},Month = {08},type = {inproceedings},note = {We present a statistical life-time description for digital systems, which is characterized by short term functional simulation. Temperature and IR-drops for each hardware task of the system are regarded based on a coarse RT-floor plan and a component wise},Abstract = {We present a statistical life-time description for digital systems, which is characterized by short term functional simulation. Temperature and IR-drops for each hardware task of the system are regarded based on a coarse RT-floor plan and a component wise prediction of the dynamic and leakage power. By iteratively updating threshold voltage and supply resistances, then dynamic and leakage power, then temperature and IR-drop distribution, electro-thermal coupling as well as long term degradation effects can be described.}}@COMMENT{Bibtex file generated on }