Publikationen
Titel
On Leakage Currents: Sources and Reduction for Transistors, Gates, Memories and Digital Systems
Publikationsart
Tagungsbeitrag
Alle Autoren
Nebel, Wolfgang; Helms, Domenik
Zusammenfassung
In only 5 years, leakage developed from an academic corner phenomenon to a central problem of embedded system design. In sub 90nm designs the leakage power is already exceeding the dynamic power. The intention of this tutorial is to review the mechanisms causing leakage and the parameters and imperfections causing leakage variation. Afterwards, the state-of-the-art in leakage reduction and management methodologies is presented with a focus on transistor design, leakage management, and low leakage SRAM architectures.
Erscheinungsdatum
2008
Titel der Konferenz
Intl. Symposium on Low Power Electronics and Design
