Handling and Characterization of Nanoscale Objects
During the last years handling and characterization of nanoscale objects has become one of the main research topics in material science and nanotechnology. In principle, one can distinguish between the “top-down” and “bottom-up” approach. Bottom-up approaches seek to have smaller (usually molecular) components built up into more complex assemblies, while top-down approaches seek to create nanoscale devices by using larger, externally-controlled components to direct their assembly. Bottom-up approaches, use chemical and physical properties of nanoscale objects to cause them to self-organize or self-assemble into a desired configuration. The top-down approach often uses traditional micro fabrication methods where externally-controlled tools are used to assembly nanoscale objects. Micro patterning techniques, such as lithography as well as nanorobotic assembly belong to this category. Therefore, one of the main goals of this workgroup is the development and use of nanorobotic systems that can be integrated into the vacuum chamber of a scanning electron microscope (SEM). The three core topics are: Nanorobotic handling and characterization of carbon nanotubes (CNTs) inside the SEM, automated atomic force microscope (AFM) based nanomanipulation, and the combination and integration of an AFM/SEM system for hybrid analysis.